Characterisation Techniques for the Study of Nanoscale Polymeric Systems in Two-and Three-Dimensions

摘要

The development of polymer-based materials, composites and devices is more intense than ever, and so techniques and methods for their characterisation have become more powerful, giving new insights into the spatial relationships between heterogeneous nanostructures. A case in point is the application of state-of-the-art focused ion beam technology (FIB), in combination with high-performance scanning electron microscopy (SEM), allowing us to generate cross-sections into bulk material and create a series of sequential images. For polymeric systems, this may require the simultaneous use of cryogenic temperatures in order to minimise any structural distortions, and strategies are also required to overcome problems associated with charge build-up when dealing with such electrically insulating specimens. With appropriate software, two-dimensional images can be correlated and volume-rendered into a three-dimensional representation. In addition, site-specific lamellar specimens can be made, for observation in the (scanning) transmission electron microscope (S/TEM), with the advantage that FIB cutting through hard-soft interfaces poses fewer difficulties compared to traditional ultra-microtomy.