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NICMOS: lessons learned for future space infrared instrumentation

机译:NicMOS:探索未来空间红外仪器

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Temperature variations in the NICMOS detectors arise from a variety of thermal sources. These thermal variations lead to several image artifacts which must be removed before making quantitative scientific measurements from NICMOS data. Future instruments would do well to minimize sources of thermal instabilities in their detectors. A related problem is the inability to directly measure detector temperature from bias due to the instability of the low-voltage power supply in NICMOS. Identifying ways to directly monitor detector temperatures would be an important benefit for future missions.
机译:NicMOS检测器中的温度变化来自各种热源。这些热变化导致几个图像伪像,在从NicMOS数据进行定量科学测量之前必须除去。未来的仪器可以很好地减少探测器中的热稳定性来源。相关问题是由于NicMOS中的低压电源的不稳定性,无法直接测量来自偏差的检测器温度。识别直接监控探测器温度的方法将是未来任务的重要益处。

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