Electrical properties of icosahedral phases (I-phase) that precipitated in Zr_(65)Al_(7.5)Cu_(7.5)Ni_(10)M_(10)(M = Ag, Pd), Zr_(65)Al_(7.5)Cu_(12.5)Ni_(10)M_5 (M = Ag, Pd), Zr_(65)Pd_(25)Ni_(10) and Zr_(70)Pd_(20)Ni_(10) metallic glasses have been investigated. In-situ resistivity change with increasing temperature was measured at a heating rate of 0.67 K/s from room temperature. I-phase transformation was occurred in the supercooled liquid phase for Zr-Al-Cu-Ni-M glasses, followed by the crystallization to stable Zr_2Ni- and Zr_2Cu-type crystals. Ternary glasses exhibited the I-phase crystallization from the glass solid phase and subsequently the transformation of I-phase to crystal phases like Zr_2Ni and Zr_2Pd. The resistivity of I-phase decreased together with advancing I-phase precipitation, about 2 % compared to the resistivity of the supercooled liquid phase, for typical Zr_(65)Al_(7.5)Cu_(7.5)Ni_(10)Ag_(10) glass. On the other hand, Zr_(70)Pd_(20)Ni_(10) glass showed the resistivity increment of about 5 % just after completing I-phase crystallization. Low temperature conductivity of Zr_(65)Al_(7.5)Cu_(7.5)Ni_(10)Ag_(10) and Zr_(70)Pd_(20)Ni_(10) glasses and I-phases may be explained by the weak localization model of conduction electron in the range from about 20 K to room temperature.
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