2D Fractal Based Logic and Sensors Applied to Particles: Ultra-fine Dispersed Systems Characterisation

摘要

Nano particles morphological and morphometrical characterisation represents one of the most challenging topics in the area of nanotechnology. Through an in depth analysis of these parameters a lot of information can be derived about nano-particulate-products characteristics and behaviour, both with regards to environmental and material sciences. The intrinsic difficulty related to the preliminary nano particles sampling, and their further analysis strongly limit the classical procedures currently adopted to perform particle and particles systems characterisation over micron sizes, where sample particle attributes detection represents the main goal. At nano-scale, on the contrary, the detectable properties of particle population, considered as a whole, assume greater importance. In this perspective new analytical logic and software sensors have to be developed. In the following a procedure is described to quantify properties of recursiveness of the physical dynamics that produces agglomeration of fine particles and their spatial arrangement, according to: i) the intrinsic material characteristics (composition, size and shape) and ii) the production and/or processing adopted. Focus on global image characteristics can provide, in fact, information on particles spatial arrangement (i.e. image topology) and on the structure of the disposition itself (i.e. fine particles size class distribution, morphometry, morphology and related disposition in a 2D domain, that is efficiency in space covering). Such a goal can be achieved by the proposed 2D-fractal based logic, based on fractal geometry and on the concept of self-similar structure of the image.