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Absorbed dose distribution of the secondary electrons near an X-ray microbeam

机译:吸收X射线微波附近二次电子的剂量分布

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Dose distributions of the secondary electrons were calculated by Monte Carlo code EGS4 in water near an infinitesimal area photon microbeam. The photon energy was from 10 to 100 keV, the radial resolution was 2 μm and the statistical error (standard deviation) was from 0.1 to 1-2% depending on the calculation point. The Compton recoil electron and photoelectron dose fractions were separated from the dose profiles and fitted by simple analytical functions.
机译:二次电子的剂量分布通过蒙特卡罗代码EGS4在水中的蒙特卡罗代码EGS4在无限的区域光子微沟附近计算。光子能量为10至100keV,径向分辨率为2μm,统计误差(标准偏差)根据计算点为0.1至1-2%。康普顿反冲电子和光电子剂剂量级分与剂量曲线分离,并通过简单的分析功能安装。

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