In this paper, we review various single-event effects in analog integrated circuits which can cause system disruption or permanent damage. We also discuss a radiation-hardened fabrication process and specific part architecture, design and simulation methodologies. These capabilities have enabled the development of a line of SEE-hardened analog and power management components. The IS9-139ASRH hardened quad comparator is used to illustrate the design methodology, and SEE data for the part is presented.
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