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Flaw Characterization Using a Double-D Pickup Coil in an Axis Symmetric Excitation

机译:使用双D拾取线圈在轴对称激励中的探伤表征

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We developed a method to evaluate the induced voltage in a double-D pickup coil caused by flaw-eddy current interaction by the axis symmetric excitation, Eddy current distribution in the aluminum plate is numerically calculated and a flaw within the plate is replaced by equivalent pair of imaginary circular currents. The current amplitude for the imaginary circular currents is obtained from the numerical result of eddy current distribution calculation. The secondary magnetic field caused by the pair of circular currents was obtained analytically. Utilizing the analytical result, we evaluated the induced voltage in a double-D pickup coil which was placed co-axially and coplanar to the exciting ring coil. Eddy current distribution in a flawless plate due to axis symmetric excitation was numerically calculated. Fig.1 shows the result for the amplitude of eddy current distribution 1.5 mm under the surface of aluminum plate, with 5 mm thickness, and conductivity s - 3.5 X 10~7 S/m. In this calculation we considered an exciting ring coil with 6.5 mm radius and 2 mm lift-off. Sinusoidal current with frequency of 2 kHz and amplitude of 1 ampere was considered. A further explanation about the calculation can be found in [1], Eddy current path changes when facing a flaw. Hence we can replace the flaw with a pair of imaginary circular currents and calculate the vector potential field produced by these two circular currents which we call it secondary field. We obtained the analytical expression for vector potential of the secondary magnetic field out of the plate: a (r,z) = integral_0~x B_1(a)e~(-az)J_1(ar)da. We calculated the voltage induced in a double-D pickup coil caused by pair of circular currents, the one of which can be seen in Fig.2. Four different overlapping of circular currents is considered. The resulted graph for induced voltage in the pickup coil can be seen in Fig.3. This figure shows how the overlap between imaginary circular currents affects on the induced voltage. By increasing the overlap between the pair of loops, the induced voltage decreases.
机译:我们开发了一种方法来评估由横梁对称激励的漏涡电流相互作用引起的双D拾取线圈中的感应电压,铝板中的涡流分布在数上计算,并且板内的缺陷由等效对取代虚构的圆形电流。从涡流分布计算的数值结果获得虚圆电流的电流幅度。由一对圆形电流引起的二次磁场分析地获得。利用分析结果,我们评估了双D拾取线圈中的感应电压,该电压在轴向和共面向励磁环线圈中放置。数值计算由于轴对称激发引起的无瑕疵板中的涡流分布。图1显示了铝板表面下的涡流分布幅度的幅度,厚度为5mm,电导率S-3.5×10〜7 s / m。在该计算中,我们考虑了一个令人兴奋的环形线圈,半径为6.5 mm半径和2 mm剥离。考虑了频率为2kHz的正弦电流和1安培的幅度。关于计算的进一步解释可以在[1]中找到,在面向漏洞时涡流路径发生变化。因此,我们可以用一对假想的圆形电流取代缺陷,并计算由这两个圆形电流产生的矢量潜在场,我们称之为次要领域。我们获得了板的次级磁场的矢量电位的分析表达:a(r,z)=积分_0〜x b_1(a)e〜(-a)e〜(-A为aaz)j_1(AR)da。我们计算了由一对圆电流引起的双D拾取线圈引起的电压,其中一个可以在图2中看到。考虑了四种不同的圆电流重叠。在图3中可以看出拾取线圈中的感应电压的所得曲线图。该图显示了虚拟圆形电流之间的重叠如何影响感应电压。通过增加一对环之间的重叠,感应电压降低。

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