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Establishing calibration tolerances for a scanning seeker optical bench by correlating influence function and code V analysis methods

机译:通过关联影响功能和CODE V分析方法建立扫描搜索器光学台阶的校准公差

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For production line manufacturing of Scanning Seekers, the optical train set-up, assembly, alignment and buy-off of optical parameters requires utilization of an automated Optical Test Bench by trained operators. Adjustment of the optical elements to obtain the specified seeker parameters, such as scan-diameter and focus, can be a time consuming iterative process if test errors and techniques of the test bench are not within sufficient accuracy limits of the end product specification. The periodic calibration of the opto-mechanical components is essential to ensure that all aspects of the test system are traceable to standards and the equipment itself has not become inflicted with random measurement errors. This paper covers the development of calibration limits and adjustment tolerances for an optical test bench using the methods of Influence Functions, analysis using Code V and addressing the limitations of optical bench components.
机译:对于扫描件的生产线制造,光学列车设置,组装,对准和光学参数的买断需要通过培训的操作员利用自动化光学测试台。如果测试替补的测试误差和技术在最终产品规格的足够精度限制范围内,则测量光学元件以获得诸如扫描直径和焦点的指定的搜索器参数,例如扫描直径和焦点,可以是迭代过程。光学元件的周期性校准对于确保测试系统的所有方面可追溯到标准,而且设备本身并未造成随机测量误差。本文介绍了使用CODE V的影响功能的方法的校准限制和调整公差,使用代码V的分析和解决光学台组件的限制。

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