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Enhancement of Upconversion Luminescence from Er Doped Al_2O_3 Films by a Thin Metal Layer

机译:通过薄金属层从ER掺杂的Al_2O_3薄膜提高上转化发光

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The effect of a metal layer on upconversion luminescence of Er doped Al_2O_3 thin films is studied. Three visible luminescence peaks, which are assigned to 2~H_(11/2)→4~I_(15/2), 4~S_(3/2)→4~I_(15/2), and 4~F_(9/2)→4~I_(15/2) transitions of Er~(3+), are observed by excitation with 978.5nm light. When a Au or Ag layer is deposited on top of the samples, the upconversion luminescence intensity is strongly enhanced. Roughness at an Al_2O_3-metal interface is considered to play a significant role for the enhancement. From the comparison of the enhancement factors between the upconversion PL and downconversion PL excited by 488.0nm light, the mechanism of the PL enhancement is discussed.
机译:研究了金属层对ER掺杂Al_2O_3薄膜的上变化发光的影响。三个可见发光峰值,分配为2〜h_(11/2)→4〜i_(15/2),4〜s_(3/2)→4〜i_(15/2),4〜f_( 9/2)→4〜I_(15/2)ER〜(3+)的过渡,通过978.5nm光的激发观察。当沉积在样品顶部的AU或AG层时,强大地增强了上变化发光强度。 AL_2O_3-METAL界面处的粗糙度被认为是对增强作用的重要作用。从增强因子之间的增强因子与488.0nm光激发的增强因子的比较,讨论了PL增强的机理。

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