Development of Thelin' Wheat Lines with Genes Lr 19 and Bdv2 from Thinopyrum elongatum and Th. intermedium

摘要

Leaf rust (caused by Puccinia triticina) and barley yellow dwarf (BYD) (caused by Barley yellow dwarf virus, BYDV) are important diseases of wheat in several wheat growing regions. Genetic resistance offers the most economical and environmentally safecontrol measure. Sharma and Knott (1966) transferred a chromosome segment from Thinopyrum elongatum to chromosome 7DL of wheat (Figure la). This segment carries leaf rust resistance gene Lrl9, which has had limited use in wheat improvement due to its linkage with a gene that causes yellowness of wheat flour. In a recent study Singh et al. (1998) found that the presence of this alien segment increases wheat grain yield by about 10%.