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Exciton dissociation and mobility in conducting polymers and oligomers

机译:在导电聚合物和低聚物中的激子解离和迁移

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A survey of the lterature shows that reverse bias current I_L of an illuminated conducting polymer Schottky diode increases with voltage. We suggest that this increase in I_L with applied reverse bias is due to a combination of two factors: 91) increase of mobility, and (2) dissociation of exitions. The experimental results agree with the values of I_L calulated using either of the two mechanisms. Therefore it is difficult to determine the relative importance of the two mechanisms. The relative importance can be determined only if reliable values of material parameters are available. We have fabricated Schottky diodes and FETs using 5-ring n-octyloxy-substituted loigl[p-phenylene vinylene](Ooct-OPV5) and C_(60). SThe mobility of the oligomer derived from the measured characteristics of the diode is 3.29x10~(-7)cm~2/Vs and from the FET data, 3.24x10~(-4) cm~2/Vs. These results show that the mobility (and other material parameters) depend strongly on the structure of the device. Therefore for interpreting the I_L data it is important to measure the material parameters on the same structure on which I_L measurements are made.
机译:对滤器的调查表明,照明电导聚合物肖特基二极管的反向偏置电流I_L随电压而增加。我们认为,具有施加反向偏差的I_L的这种增加是由于两个因素的组合:91)移动性的增加,并且(2)出现的解离。实验结果与使用两种机制中的任何一种同意I_L的值。因此,难以确定两个机制的相对重要性。只有在可用的材料参数值可用时才可以确定相对重要性。我们使用5环N-辛氧基取代的LOIGL [对苯基乙烯基](OOCT-OPV5)和C_(60)制造了肖特基二极管和FET。源自二极管的测量特性的低聚物的迁移率为3.29x10〜(-7)cm〜2 / vs,从FET数据,3.24x10〜(-4)cm〜2 / vs。这些结果表明,迁移率(和其他材料参数)强烈依赖于设备的结构。因此,为了解释I_L数据,重要的是测量在其上进行I_L测量的相同结构上的材料参数。

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