Microwave frequency reference based on VCSEL-driven dark-line resonances in Cs vapor

摘要

Dark-line resonances in Cs vapor are studied for potential use in a compact, low-power microwave frequency reference. The resonance is excited using light from a VCSEL and detected using the change in DC absorption, resulting in an extremely simple physics package with very high tolerance to misalignment and potentially low acceleration sensitivity. We anticipate engineering the package developed into a device with a volume less than 1 cm/spl times/1 cm/spl times/2 cm and a power dissipation of much less than 100 mW, depending on the thermal environment.