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DRIVE LEVEL DEPENDENCE VERSUS RESIDUAL PHASE NOISE OF FIFTH OVERTONE AT CUT QUARTZ CRYSTALS

机译:在CUT石英晶体中驱动水平依赖性与第五个泛音的剩余相位噪声

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Currently no valid method of choosing low noise AT cut crystals during crystal manufacturing is available within the crystal manufacturing industry. Drive level dependence (DLD) is a parameter, which can be readily measured by most crystal manufacturers. This paper makes a comparison of DLD measurements to residual phase noise measurements of fifth overtone AT crystals with fixed electrical parameters from various manufacturers. A discussion of crystal manufacturing methods pertaining to reproducibility of low noise fifth overtone AT crystals is also briefly discussed.
机译:目前,在晶体制造业中,没有有效地在晶体制造过程中选择晶体的低噪音。驱动级别依赖(DLD)是一个参数,可以通过大多数晶体制造商轻松地测量。本文对DLD测量与来自各种制造商的固定电气参数的晶体的晶体的残余相位噪声测量进行了比较。还简要讨论了晶体制造方法的讨论,其晶体低噪声的低噪声第五吞咽可再现。

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