SAXS Analysis of Embedded Pt NanocrystalsIrradiated with Swift Heavy IonsR

摘要

Elongated Pt nanocrystals (NCs) formed in SiO_2 by ion implantation, thermal annealing and swift heavy ion irradiation were analyzed by small-angle X-ray scattering (SAXS) and transmission electron microscopy (TEM) measurements. Transmission SAXS measurements were performed in samples aligned at different angles relative to the photon beam resulting in non-isotropic scattering and thus enabling the three dimensional analysis of the NCs. Selected angular sectors of the detector were integrated and analyzed separately, leading to the individual evaluation of both the major and minor dimensions of the rod-shaped NCs. This method enables the use of well established spherical models for the SAXS data analysis and yielded excellent agreement with TEM results.