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In situ Ru K-edge XAFS Studies of Electroprecipitated Ruthenium Dioxide Films with Relevance to Supercapacitor Applications

机译:原位ru K-Edge XAFS研究与超级电容器应用相关的电抛型钌二氧化钌膜

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The nature of the electrochemical processes associated with the rather unique capacitive behavior of RuO_2 in strongly acidic electrolytes continues to elude unambiguous identification.Much of the effort in our laboratory has been aimed at monitoring in situ changes in the electronic and structural properties of this material in a Nafion-based supercapacitor type environment as a function of the applied potential using X-ray Absorption Spectroscopy (XAS).Although the feasibility of such type of measurements was clearly demonstrated,the changes observed in the Ru K-edge features as the state of charge of the capacitor was varied were found to be very small.
机译:与强酸性电解质中ruo_2的相当独特的电容性能相关的电化学过程的性质继续避开明确的识别。我们实验室中的努力的旨在监测这种材料的电子和结构性质的原位变化基于Nafion的超级电容器型环境作为使用X射线吸收光谱(XAS)的施加电位的函数。尽管这种测量类型的可行性明确说明,但在Ru K-Edge的特征中观察到的变化为状态发现电容器的电荷变化非常小。

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