Fast X-ray Measurement System for Structural Study in Zr sub 60AL sub 15Ni sub 25 Supercooled Liquid

摘要

A fast x-ray measurement system adopting he geometry fo the debye-scherrer camera in combination with an imaging plate has been developed for the structural study of supercooled liquid. We carried out the anomalous x-ray scattering measurement as well as the ordinary x-ray diffraction measurement iwth this system in Zr sub 60Al sub 15Ni sub 25 supercooled liquid at 720K above the glass transition temperature. A whole diffraction profile of very good counting staitistics that even fits to the AXS analyses is obtained for a very short time. The analyses of scattering data obsreved in the Zr sub 60Al sub 15Ni sub 25 supercooled liquid for various annealing times in this system provide us information on a change of local atomic structures in the liquid state.