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Microstructure and Mechanical Properties Characterisation of Nanocrystalline Copper Films

机译:纳米晶体铜膜的微观结构和力学性能

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The microstructure and mechanical properties of nanocrystalline copper with grain size ranging from 50 nm to 80 nm have been investigated. Nanocrystalline copper films were electrodeposited from an additive-free acidified copper sulphate solution at room temperature by employing constant current at different current density magnitudes between 20 and 80 mA/cm~2. Both austenitic and ferritic steel substrates with the same surface finishing conditions have been used for the deposition. The microstructure of the films has been further studied using electron microscopy techniques, and the mechanical properties using nanoindentation technique. The nanoindehtation study was carried out on both the plan view and cross-sectional directions to study the isotropy characteristic of the copper film. It has been noted that both the modulus and hardness measured following the Oliver-Pharr scheme show an apparent indentation size effect tested on the cross-sectional sample.
机译:研究了纳米晶铜的微观结构和机械性能,晶粒尺寸范围为50nm至80nm。通过在室温下通过采用20至80mA / cm〜2的不同电流密度幅度的恒定电流在室温下将纳米晶铜膜电沉积在室温下从不含添加剂的酸化铜硫酸盐溶液。具有相同表面精加工条件的奥氏体和铁素体钢基材均已用于沉积。通过电子显微镜技术进一步研究了薄膜的微观结构,以及使用纳米狭窄技术的机械性能。在平面图和横截面方向上进行纳米温度化研究,以研究铜膜的各向同性特征。已经注意到,OLIVER-PHARR方案后测量的模量和硬度均显示在横截面样品上测试的表观凹凸尺寸效应。

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