X-ray Microbeam Investigation of Deformation Microstructure in Microindented Cu

摘要

The deformation microstructure under spherical microindents in single crystal Cu has been investigated with submicron spatial resolution using x-ray structural microscopy.A polychromatic,submicron diameter (approx 0.5 mum) microbeam was used in combination with micron-resolution depth profiling to make direct,nondestructive measurements of plastic deformation induced lattice rotations under an indent made with 69 mum radius spherical indenter and 200 mN maximum load.Lattice orientations relative to the undeformed crystal were determined as a function of position under the indent using differential-aperature x-ray structural microscopy (DAXM).Rotation-axes and misorientation-angles were determined for micron steps along selected microbeam penetration directions.