3-D Measurement of Deformation Microstructure of Al(0.2%)Mg Using Submicron211 Resolution White X-Ray Microbeams

摘要

We have used submicron-resolution white x-ray microbeams on the MHATT-CAT211u001ebeamline 7-ID at the Advanced Photon Source to develop techniques for three-211u001edimensional investigation of the deformation microstructure in a 20% plane strain 211u001ecompressed Al(0.2%)Mg tri-crystal. Kirkpatrick-Baez mirrors were used to focus 211u001ewhite radiation from an undulator to a 0.7 x 0.7 (micro)m(sup 2) beam that was