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Characterization of Bulk CdZnTe by IR Transmission Imaging

机译:红外传输成像对散装Cdznte的表征

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Performance and yield of CdZnTe (CZT) nuclear radiation detector arrays are sensitive to bulk defects introduced at all stages of material processing. Ingots of CZT grown by the High Pressure Bridgman process contain several kinds of bulk material defects (BMD↓(s)) which can affect nuclear detector performance. In this study infrared transmission imaging was used to locate and identify certain BMD↓(s) in four-inch CZT wafers produced by Digirad. The correlation of performance of subsequently processed pixel arrays with IR image features demonstrates the predictive value of this method.
机译:Cdznte(CZT)核辐射探测器阵列的性能和产量对材料加工所有阶段引入的散装缺陷敏感。高压Bridgman工艺种植的CZT锭含有几种散装材料缺陷(BMD↓(S)),可以影响核探测器性能。在该研究中,红外传输成像用于定位并识别由DigiRad产生的四英寸CZT晶片中的某些BMD↓(S)。随后处理具有IR图像特征的Proced Pixel阵列的性能的相关性演示了该方法的预测值。

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