Using two measurements in vacuum and under condition for condensing water, one might more correctly determine the true refractive index N$-true$/ and porosity Q with Bruggeman's EMA. The characteristics of chamber-attachment to ellipsometer, algorithm and application samples of new method for SiO$-2$/, ZrO$-2$/, HfO$-2$/, a-C:H, and In$- 2$/O$-3$/-SnO$-2$/ films are presented. It is found that the differences between measurements of an effective refractive index N$-ef$/ in air, in vacuum and with condensed water may be up to 0.09. The void fraction for these films are range from 0 to 0.277, Difference between N$-true$/ and N in air may be up to 0.036.
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