首页> 外文会议>ASME International Mechanical Engineering Congress and Exposition >REMOVING THE HOT-SPOTS IN HIGH POWER DEVICES USING THE THERMOELECTRIC COOLER AND MICRO HEAT PIPE
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REMOVING THE HOT-SPOTS IN HIGH POWER DEVICES USING THE THERMOELECTRIC COOLER AND MICRO HEAT PIPE

机译:使用热电冷却器和微热管在高功率器件中取出热点

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Due to localized high heat fluxes, hot-spots are created in silicon chips. Cooling of the hot-spots is one of the major thermal challenges in today's integrated circuit (IC) industry. Many researches have been conducted to find ways to cool hot-spots using different techniques as uniform heating is highly desired. This paper focuses on cooling of hot-spot using conventional thermoelectric cooler (Melcor_CP1.0-31-05L.1) and a micro heat pipe. A chip package with conventional integrated heat spreader and heat sink was designed. Hot-spot was created at the center of the silicon die with background heat at rest of the area. The heat flux on the hot-spot was much greater than rest of the area. Forced convection was used to cool IC package, temperature was observed at active side of the silicon die. After that a copper conductor was used to take away heat directly from the hot-spot of the silicon die to the other end of the conductor which was cooled using the thermoelectric cooler. Finally the conductor was replaced by a heat pipe and a comparison between three cases was done to study the cooling performance using the commercial software, ANSYS Icepak. The effect of trench on silicon die was also studied.
机译:由于局部高热量通量,在硅芯片中产生热点。冷却热点是当今集成电路(IC)行业的主要热挑战之一。已经进行了许多研究以找到使用不同技术冷却热斑的方法,因为非常需要均匀的加热。本文侧重于使用常规热电冷却器(Melcor_CP1.0-31-05L.1)和微热管冷却热点。设计了一种带传统的集成散热器和散热器的芯片封装。在硅的中心在硅模具的中心创造了热点,在该地区的其他地区的背景热。热点上的热通量远大于该地区的其余部分。强制对流用于冷却IC封装,在硅模的活性侧观察温度。之后,使用铜导体直接从硅管芯的热点带到导体的另一端使用热电冷却器冷却。最后,导体被热管取代,完成了三种情况的比较,以研究使用商业软件ANSYS ICEPAK研究冷却性能。还研究了沟槽对硅模具的影响。

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