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Problems and precautions in high-precision two-beam microinterferometry

机译:高精度双梁微内干扰法的问题和预防措施

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Stray light (glare) in Jamin-Lebedeff interference microscopes, partly due to bubbles in the calcite plates of the objectives, can be reduced by limiting the area of field illuminated. Glare degrades visual image contrast and can cause measuring errors in systems which depend on the measurement or comparison of light intensities, but has no significant effect on measurements in a microinterfereometer which uses phase-modulated light. The apparent OPD of a very thin object mounted in a given medium can be significantly affected by phase changes due to reflections at the interfaces with the preceding and successive media. The error can be reduced or eliminated if the refractive indices of the specimen and the supporting slide are similar, and/or if the reference medium is air and no coverglass is used. In principle, the geometrical thickness and refractive index of a plane object such as a plastic microtome section in a given reference medium can be obtained from microinterferometric measurements using different obliquities of transmitted light. Currently available microinterferometers are not, however, precise and accurate enough for the method to be practical with objects only about a wavelength thick.
机译:在Jamin-Lebedeff干扰显微镜中的杂散灯(眩光),部分原因是通过限制照明的场面积来降低目标中的燃气板中的气泡。眩光降低了视觉图像对比度,可以导致依赖于光强度的测量或比较的系统中的测量误差,但对使用相位调制光的微串仪中的测量没有显着影响。由于与前一和连续介质接口的反射,所安装在给定介质中的非常薄的物体的表观OPD可以显着受相位变化的影响。如果样品的折射率和支撑载体的折射率相似,并且/或如果参考介质是空气,则可以减少或消除误差,并且使用覆盖玻璃。原则上,诸如给定参考介质中的塑料小运动部分的平面物体的几何厚度和折射率可以使用不同的透射光的微容器测量获得。然而,目前可用的微内风仪不是精确和准确,足以使该方法具有仅与波长厚的物体实用。

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