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Reconfigurable FPGA's dual role: in-system test and system level logic

机译:可重新配置的FPGA的双重作用:在系统中测试和系统级逻辑

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Static RAM based field programmable gate arrays (FPGAs) solve the overhead problem because they can be reconfigured in-system any number of times. This unique capability allows the same device to perform a variety of functions without increasing board space or power or sacrificing system performance. When the system is powered up, a special diagnostic configuration can be loaded into the FPGA and test vectors can be applied to the device. Once circuit and board integrity are verified, another configuration file can be loaded into the SRAM cells of the FPGA. Subsequent configuration files can contain any number of logic configurations for the device, enabling it to perform system-level functions. With some thought and creativity, any SRAM FPGA can be configured to test itself. As more and more engineers incorporate on-chip diagnostics into their FPGA designs, self-testing applications will become more sophisticated. This paper explores the dual role of reconfigurable FPGAs in-system: system level logic functions and in-system diagnostics.
机译:基于静态RAM的字段可编程门阵列(FPGA)解决了开销问题,因为它们可以在系统内重新配置任何次数。这种独特的能力允许同一设备在不增加底板空间或电源或牺牲系统性能的情况下执行各种功能。当系统通电时,可以将特殊的诊断配置加载到FPGA中,并且可以将测试向量应用于设备。一旦验证了电路和板完整性,可以将另一个配置文件加载到FPGA的SRAM单元中。后续配置文件可以包含设备的任意数量的逻辑配置,使其能够执行系统级功能。通过一些思想和创造力,可以配置任何SRAM FPGA来测试自己。随着越来越多的工程师将片上诊断纳入其FPGA设计,自检应用将变得更加复杂。本文探讨了重新配置FPGA在系统中的双重作用:系统级逻辑功能和系统内诊断。

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