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Cathodoluminescence study of defects in optical fiber preforms

机译:光纤预成型件缺陷的阴极致发光研究

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The cathodoluminescence technique has been used to analyze germanosilicate optical fiber preforms fabricated by the MCVD process. The distributions E' and drawing-induced defects have been measured and the effects of some co-dopants and fabrication conditions on the distributions have been investigated. The results have been explained in terms of a simple reaction scheme involving the electron donor and acceptor properties of co- dopants.
机译:通过MCVD工艺制造的阴极发光技术已用于分析蒙透硅硅酸盐光纤预制件。已经测量了分布E'和拉伸诱导的缺陷,并研究了一些共掺杂剂和一些共掺杂剂和制造条件的效果。结果已经以简单的反应方案解释,涉及电子供体和共掺杂剂的受体性质。

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