Optical testing by means of one-dimensional interferogramsperformed with a point-diffraction interferometer

摘要

Frequently two-dimensional interferograms are obtained when a point-diffraction interferometer (PDI) is used in opticaltesting. The PDI is an experimental set up simple, convenient and robust tool for optical shop testing. In this paper, wepropose the use of the PDI and placing a slit at the exit pupil of the lens or system under test. Scanning the wavefrontwith the slit; the stitching technique is used to generate a phase map of the test wavefront. The idea behind to use the slitis to have an alternative method for testing lenses without spherical symmetry at the exit pupil, we describe the methodand some experimental results.