LIF measurement of CH* radical state through chemical sputtering

摘要

The detection of CH$+*$/ radicals was made by the laser-induced fluorescence method. CH$+*$/ radicals were formed through chemical sputtering processes of isotropic graphite targets irradiated by hydrogen ions in the low keV range and at temperatures around 700 K. Fluorescent spectra of CH$+*$/ radicals induced by a flashlamp-pumped dye pulse laser were obtained by a photo-multiplier tube as a function of wavelength. The detailed structure of the chemical and electronic states of CH$+*$/ radicals can be extracted from highly resolved fluorescent spectra.