A parallel printed circuit board test system with artificial intelligence technique is discussed, and the algorithms for the intragroup test and the intergroup test are described. The basic idea is to read the standard connection status and compare it with the connection status of the test board. The concept of the expert system with the statistical analysis of the fault database is used to reduce the test time. The parallelism also reduces the test time. From the knowledge of the fault data, the fault trend can control activity at the manufacturing site. The test equipment is expandable by adding more controller and pin electronics.
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