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Nondestructive Testing for Shallow Defect of Ferromagnetic Objects Based on Magnetic Probe Structure.

机译:基于磁探头结构的铁磁物体浅缺陷无损检测。

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摘要

Summary form only given. The Electromagnetic inspection technique plays an important role in the nondestructive testing (NDT) for many decades. Today, this NDT area is rather wide and significant. The magnetic flux leakage (MFL) technology is one of the most widely used electromagnetic nondestructive testing (NDT) techniques. MFL tools use permanent magnets to magnetize the detected object near to saturation flux density [1], [2]. Generally, the magnetizer mechanism of MFL are bulky and heavy. Although the shape of the opening and the depth profile of an arbitrary three-dimensional (3-D) defect from MFL measurements can be estimated [3], the inversion method is complicated and susceptible by the magnetization factors. For different shapes and different sizes of detected object, the magnetizer mechanism of MFL should be designed individually, and this requires a lot of time and experimentation. In this paper, a simple and portable magnetic detection device is designed with permanent magnets, magnetic probe structure and the Hall sensors. Compared with the magnetizer mechanism of MFL, the magnetic detection device is very light, low cost and easy to design and manufacture. The magnetic detection device can make qualitative, and quantitative evaluation for shallow defect of ferromagnetic objects. The designed magnetic detection device is made of permanent magnets, magnetic probe structure and the Hall sensors in Fig. la. The designed magnetic detection device is not to magnetize the detected object near to saturation fl ux density, instead use the permanent magnets to generate the magnetic field that perpendicular to the surface of the detected object. The magnetic probe structure is made of high permeability materials, is used to gather the magnetic field. Through the magnetic probe structure, the direction of magnetic field is better, and the magnetic field intensity is stronger than generated by permanent magnets. During the testing process, there is no defect on the detected object, and there is no change of the direction of magnetic field under the probe structure. If there is defect on the detected object and nearby the magnetic probe structure. Because the magnetic resistance of th e defect is far greater than the magnetic resistance of the intact surface, the balance of the magnetic circuit of detection system is destroyed, it causes the direction of magnetic field under the probe structure be changed. The Hall sensors detect the changes of the magnetic field under the probe structure to qualitative and quantitative evaluation the shallow defect of ferromagnetic objects. In this paper, the above phenomenon is analyzed by FEM in Fig. lb, and through the simulation analysis, we optimized the magnetic circuit to high sensitivity and precision of the detection system. The magnetic detection device based on magnetic probe structure for the plate, wire -rope and pipe are designed (in Fig. 2a and 2b). Through simulations and experiments, we find the magnetic detection device can make qualitative and quantitative evaluation for shallow defect of ferromagnetic objects. The waveform of defect on the plate is shown in Fig. 2c, and the result of detection of wire -rope is shown Fig. 2d. For wire -rope detection, the weight of the detection device is one thirtieth of the weight of the magnetic leakage detector, and the qualitative detection rate of defect is the same as the magnetic leakage detection. At the same time, it has certain quantitative detection precision.
机译:摘要表格仅给出。电磁检测技术在多十年中在非破坏性测试(NDT)中起着重要作用。如今,这个NDT区域相当宽阔且重要。磁通泄漏(MFL)技术是最广泛使用的电磁无损检测(NDT)技术之一。 MFL工具使用永磁体磁化靠近饱和通量密度的检测到的物体[1],[2]。通常,MFL的磁化器机构庞大和重。尽管可以估计来自MFL测量的任意三维(3-D)缺陷的开口的形状和从MFL测量的缺陷,但反转方法是复杂且易受磁化因子的影响。对于不同形状和不同尺寸的检测到的物体,MFL的磁化器机制应该单独设计,这需要大量的时间和实验。在本文中,简单且便携式的磁检测装置设计有永磁体,磁探头结构和霍尔传感器。与MFL的磁化器机构相比,磁检测装置非常轻,成本低,设计易于设计和制造。磁检测装置可以对铁磁物体的浅缺陷进行定性和定量评估。设计的磁检测装置由永磁体,磁探头结构和图1中的霍尔传感器制成。设计的磁检测装置不是靠近饱和F1 UX密度的检测到的物体磁化,而是使用永磁体产生垂直于检测到的物体表面的磁场。磁探头结构由高渗透材料制成,用于收集磁场。通过磁探针结构,磁场的方向更好,磁场强度比永磁体产生强。在测试过程中,检测到的物体上没有缺陷,并且在探针结构下没有磁场方向的变化。如果检测到的物体上存在缺陷,并且附近磁探针结构。因为Th E缺陷的磁阻远大于完整表面的磁阻,所以检测系统的磁路的平衡被破坏,导致探针结构下的磁场方向改变。霍尔传感器在探头结构下检测磁场的变化,以定性和定量评估铁磁物体的浅缺陷。在本文中,通过图1B的有限元分析了上述现象,并通过模拟分析,我们优化了磁路以高灵敏度和检测系统精度。设计了基于磁探头结构的磁检测装置,设计(在图2A和2B中)设计。通过模拟和实验,我们发现磁检测装置可以对铁磁物体的浅缺陷进行定性和定量评估。板上的缺陷波形如图2所示。图2C示出了焊丝检测结果。图2D。对于丝 - 检测,检测装置的重量是磁漏检测器的重量的一度,并且缺陷的定性检测速率与磁漏检测相同。同时,它具有一定的定量检测精度。

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