Designing an Impedance Matched Test Fixture Using Parameterized Optimization and the Modal Projection Error

摘要

1. MPE is a new and novel way to optimize a structure as it only focuses on shape space. 2. The optimization algorithm was able to converge to the global solution when the global solution was in the design space. 3. Matching response at a location is not a good indication of matching stress of the unit under test. 4. Although a perfectly impedance matched system is unique (unproven hypothesis), this research showed that a fixture can be designed that partially matches the impedance of the next level of assembly, say for the first couple mode shapes. This allows for these modes to be well represented in a laboratory test.