Digital holography for evaluation of the refractive index distribution externally induced in semiconductors

摘要

In this paper, we analyse the capabilities of the digital holographic approach for evaluation of the refractive index distribution appearing in semiconductor materials due to external optical excitation. The study is based on a modified transmission Mach-Zehnder holographic microscope operating in the near-infrared spectral range. Practical considerations for holographic characterization of semiconductor samples are discussed. Experimentally measured data are compared with simulations as well as approaches to interpretation of the retrieved data are covered.