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Finding the Redundant Gates in Reversible Circuits

机译:在可逆电路中找到冗余栅极

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The paper presents a BDD-based post-synthesis technique to detect the redundant gates in a reversible circuit. Given a reversible circuit C, we are looking for a maximal (or most costly) subset of gates in C that can be removed from C without altering the functionality of the circuit. The runtime of the new algorithm is linear in the size of the involved binary decision diagrams (BDD). In order to lower the runtimes, the presented approach is extended to handle the restricted problem of only looking for up to k gates that can be removed from C for some constant k. This restriction should ensure that the sizes of the involved BDDs remain practicable for adequate constants k.
机译:本文提出了基于BDD的后合成技术,用于检测可逆电路中的冗余栅极。考虑到可逆电路C,我们正在寻找C的最大(或最昂贵)的栅极子集,可以在不改变电路的功能而不改变电路的情况下。新算法的运行时间是涉及的二进制决策图(BDD)的大小的线性。为了降低运行时间,延长所提出的方法以处理只能寻找最多k个门的限制问题,该k门可以从c中移除一些常数k。这种限制应确保所涉及的BDD的尺寸仍然可用于足够的常数k。

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