首页> 外文会议>International Symposium of the Society of Core Analysts >NMR SURFACE RELAXIVITY DETERMINATION USING NMR APPARENT DIFFUSION CURVES AND BET MEASUREMENTS
【24h】

NMR SURFACE RELAXIVITY DETERMINATION USING NMR APPARENT DIFFUSION CURVES AND BET MEASUREMENTS

机译:使用NMR表观扩散曲线和BET测量的NMR表面松弛率测定

获取原文

摘要

The surface relaxivity is an important parameter in low field NMR T2 or T1 relaxation experiments.It can be determined from the apparent diffusion curve at short time.We show in this paper the applicability and limitations of this technique in various situations(grain packs,sandstones,carbonates) and compared the results with BET. We show first that the V/S ratio is better determined using a fit considering the entire apparent diffusion curve D(t) from short to long diffusion time typically in the range 10 to 1000 ms.The method is validated using a grain pack made of a reference material used in BET measurements with a known specific surface area. We show various measurements illustrating the proposed procedure.On grain packs made with the same material,the measured V/S ratios are proportional to the grain size.On a suite of Fontainebleau sandstones with different porosity and permeability,we obtained a weak variation of the pore size distribution when scaled by surface relaxivity, as expected for this type of formation.On carbonates,the specific surface is often too high to allow reliable NMR S/V measurements with the actual instrument limitations.In these cases,the BET measurement can be used instead.After calibration,the V/S distributions obtained from T2 measurements are smaller than mercury injection derived throat size distributions,as expected.
机译:表面松弛率是低场NMR T2或T1松弛实验中的重要参数。可以从短时间内的表观扩散曲线确定。本文展示了这种技术在各种情况下的适用性和限制(谷物包装,砂岩,碳酸盐)并将结果与​​赌注进行比较。首先,首先,使用拟合从短到长扩散时间的整体扩散曲线D(t)通常在10至1000毫秒的范围内,更好地确定V / S比。使用谷粒子验证了该方法使用已知的特定表面积的BET测量中使用的参考材料。我们显示各种测量,说明了所提出的方法。用相同材料制成的谷物包装,测量的v / s比例与晶粒尺寸成比例。在不同孔隙率和渗透性的含有不同孔隙和渗透性的塑料砂岩套件的套房孔径分布在表面松弛率缩放时,如预期的这种类型的形成。碳酸盐,比表面往往太高,无法通过实际仪器限制来允许可靠的NMR S / V测量。在这些情况下,BET测量可以是校准后,从T2测量获得的V / S分布小于汞注入辐射喉部尺寸分布,如预期的那样。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号