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SYSTEMATIC ERRORS IN DEFLECTOMETY INDUCED BY USE OF LIQUID CRYSTAL DISPLAYS AS REFERENCE STRUCTURE

机译:通过使用液晶显示器诱导的裂化术误差作为参考结构

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Deflectometric measurements are based on observing a known reference structure via the reflective or refractive surface under test. Many up-to-date deflectometry systems are using a liquid crystal display (LCD) as reference structure, as those allow a flexible pattern generation. In most of these cases the display is regarded as an ideal flat surface emitting structured light with a characteristic close to a lambert radiator. Closer observation, however, reveals that the properties and behavior of LCDs are non-ideal in a number of aspects. Therefore the insufficient consideration of the real display behavior induces systematic errors in deflectometry, which are relevant especially if the absolute shape is to be measured. The present contribution gives an overview of the main characteristics of LCDs that cause systematic errors in deflectometric shape measurements and discusses ways to improve the model description of displays used as deflectometric reference.
机译:偏转测量是基于通过被测反射或折射表面观察已知的参考结构。许多最新的偏转测量系统使用液晶显示器(LCD)作为参考结构,因为允许柔性图案产生。在大多数这些情况下,显示器被认为是一种理想的平坦表面,其发射结构光具有靠近Lambert散热器的特性。然而,仔细观察揭示了LCD的性质和行为在许多方面是非理想的。因此,对真实显示行为的不充分考虑在偏转测量中引起系统误差,其特别是如果要测量绝对形状。目前的贡献概述了LCD的主要特征,其导致偏转量度测量中的系统误差并讨论了改进用作偏转率参考的显示器的模型描述的方法。

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