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Organosoluble Polyelectrolyte-Surfactant Complexes

机译:有机溶胶聚电解质 - 表面活性剂配合物

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Organosoluble polyelectrolyte-surfactant complexes (PSCs) based on cationic polymer - JR-400 and anionic surfactant - sodium salt of dodecylbenzenesulfonate (SDDBS) were isolated as a precipitate from polyelectrolyte/surfactant aqueous mixture. The reduced viscosity of JR-400/SDDBS in ethanol showed polyelectrolyte anomaly that was suppressed upon addition of 0.05N and 0.1N KBr. Light scattering measurements of JR-400/SDDBS in ethanol showed 4 peaks belonging to non-aggregated and aggregated polycomplex particles. The elemental composition and morphology of thin layers of polyelectrolyte-surfactant complexes deposited on SiO2 surface were evaluated by scanning electron microscopy (SEM) and atomic force microscopy (AFM). The height of PSC aggregates evaluated using AFM and Surface Enhanced Ellipsometry Contrast (SEEC) microscopy data is in good agreement and range within 10-50 nm. The XRD analysis revealed that PSCs have amorphous structure with a broad halo near 20 8. The contact angle measurements were used to demonstrate the hydrophobization of glass surface after the deposition of PSCs.
机译:基于阳离子聚合物-JR-400和阴离子表面活性剂 - 二甲基苯磺酸氢磺酸盐(SDDDB)的有机溶胶聚电解质 - 表面活性剂络合物(PSC)分离为来自聚电解质/表面活性剂水性混合物的沉淀物。在加入0.05N和0.1NKBR时,乙醇中的JR-400 / SDDBS的粘度降低显示聚电解质异常。乙醇中的JR-400 / SDDB的光散射测量显示为属于非聚集和聚集的聚拷颗粒的4个峰。通过扫描电子显微镜(SEM)和原子力显微镜(AFM)评价沉积在SiO 2表面上沉积在SiO 2表面上的聚电解质表面活性剂络合物的元素组成和形态。使用AFM和表面增强的椭圆测定法评估PSC聚集体的高度对比度(SEEC)显微镜数据非常一致,范围在10-50 nm内。 XRD分析表明,PSCs具有宽晕塔附近的非晶结构。接触角测量用于证明在PSC沉积后玻璃表面的疏水化。

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