Simultaneous Fast Scanning Chip Calorimetry And Time-Resolved X-ray Scattering

摘要

Calorimetry is often used for studying phase transitions such as crystallization and melting. The corresponding structural or microstructural information about the sample under investigation is either indirectly derived from calorimetry or obtained from other experimental methods like AFM, electron microscopy or X-ray diffraction. If the calorimetric and structural information is obtained in separate experiments using different instruments and sample environments, even though the applied temperature program is the same, a complete congruity of the sample history can never be achieved. However, if both the calorimetric and structural characterization measurements are performed simultaneously and on the same sample volume, the desired internal consistency between the calorimetric and structural data is achieved. In this contribution we will report about our progress in the development of simultaneous fast scanning chip calorimetry and time-resolved X-ray diffraction (TR-XRD) at a synchrotron source. The challenge for such experiments is the necessary balancing act between small samples, which enable fast scanning, on one hand and enough sample volume for a good signal-to-noise ratio for TR-XRD on the other.