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Hcromagnetic method of s-parameter characterization of magnonic devices

机译:千兆件S参数表征的HCRomagnetic方法

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Designers of nano-scale magnonic devices would benefit from methods of their evaluation that do not require one to access the microscopic level of description or to construct device prototypes. Here, we propose a numerical micromagnetics version of such a method, in which magnonic devices are considered as two-port linear networks and can therefore be described in terms of their s-parameters (i.e., reflection and transmission characteristics). In the micromagnetic model, the sample is composed from a magnonic device-under-test situated between input and output magnonic waveguides. First, dispersion relations and amplitudes of spin waves in the input and output waveguides are calculated from the simulations. The results are then compared to derive the s-parameters of the device-under-test. We use a simple rectangular magnetic nonuniformity, for which analytical results are readily obtained, to evaluate the efficiency and limitations of the technique in the sub-terahertz band.
机译:纳米级磁性装置的设计者将受益于其评估的方法,这些方法不需要一个来访问微观描述的描述或构建设备原型。这里,我们提出了一种这样的方法的数控微磁版本,其中延长装置被认为是双端口线性网络,因此可以根据其S参数来描述(即反射和传输特性)。在微磁模型中,样品由位于输入和输出磁波之间的延长型试验中。首先,从仿真计算输入和输出波导中的旋转波的色散关系和幅度。然后将结果进行比较,以导出器件欠测试的S参数。我们使用简单的矩形磁性非均匀性,用于易于获得分析结果,以评估亚太赫兹带中该技术的效率和限制。

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