Development of soft X-ray excited optical luminescence (XEOL) measurement setup at beamline 4 in INDUS-1 synchrotron radiation source

摘要

We developed an experimental setup for the measurement of soft X-ray excited optical luminescence at the reflectivity beamline (BL-4), Indus-1 synchrotron radiation source. The soft X-ray excited visible luminescence signal from sample was collected using a lens assembly and focused on to a ～200 μm optical fiber coupled to thermoelectric (TE) cooled spectrometer. The photo luminescence signal from the samples mounted inside a vacuum chamber was brought to the luminescence collection unit mounted in the air through a glass view port. The toroidal grating monochromator of the beamline provided the soft x-rays for excitations in the range of ～10 eV to 300 eV (100 nm - 4 nm) and the resultant optical luminescence was recorded in the range of ～350 nm to 900 nm. The developed setup was demonstrated by the recording the visible emission from standard scintillator materials (Cr:Al_2O_3, Ce:YAG, etc.) and β-Ga_2O_3 nanostructure.