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A 2-D scalable, VHF/UHF compatible, capacitively coupled plasma source for large-area applicaiton

机译:用于大面积应用的2-D可扩展,VHF / UHF兼容,电容电容耦合等离子体源

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A novel plasma source topology is described. The design is similar to a traditional capacitive diode, except the powered electrode is divided into a 2-dimensional tile array. Neighbouring tiles are powered 180-degree out of phase. Current coupled to the plasma through one tile is canceled by the neighboring tile, resulting in zero net current into the plasma and substrate. In this way, wavelength-effects causing center-to-edge voltage non-uniformities are avoided. This breaks the relationship between substrate size and rf frequency, enabling high-VHF to UHF frequency capacitive plasma sources for application to large area substrates. Plasma density profiles for a 300mm size system have good uniformity at 400 MHz, where the plasma loaded wavelength is about 50mm. The electromagnetic coupling in this configuration is considered. A 600x720 mm~2 multi-tile plasma source operated at 162 MHz is used to deposit PECVD Silicon with a narrow plasma gap (as low as 6mm) giving good uniformity films, without the 1/4-wavelength voltage non-uniformity effects.
机译:描述了一种新的等离子体源拓扑。该设计类似于传统的电容二极管,除了电极被分成二维瓦片阵列。邻近的瓷砖是180度的阶段。通过相邻的瓦片取消通过一个瓦片耦合到等离子体的电流,导致零净电流进入等离子体和衬底。以这种方式,避免了引起中心到边缘电压不均匀的波长效应。这会破坏基板尺寸和RF频率之间的关系,使高VHF到UHF频率电容等离子体源以应用于大面积基板。 300mm尺寸系统的等离子体密度分布在400 MHz处具有良好的均匀性,其中等离子体负载波长约为50mm。考虑这种配置中的电磁耦合。在162MHz下操作的600x720mm〜2多块等离子体源用于将PECVD硅沉积,具有窄的等离子体间隙(低至6mm),其具有良好的均匀性薄膜,而没有1/4波长电压不均匀效果。

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