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Cu wire neck fatigue fracturing elimination

机译:铜线颈疲劳断裂消除

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摘要

This paper present the challenges of elimination on Cu wire neck fatigue fracturing issue after TC (Temperature Cycle) and IOL (Intermittent Operational Life Test). The qualification lots were detected fracturing after TC1000 cycles and IOL15000 cycles due to stress inner of package; after detail analyze the cross section samples, there is no any abnormal was found from fresh unit; but the minor cracks were detected along the grain edge of Cu crystalloid from TC/IOL units. A big challenge is to search out the key factors which are for fatigue fracturing. As presented in this paper, the Wire Looping Length, Looping Type, Loop Reversion Data, Free Air Ball Size, Wire Type, Wire Grain Size, Capillary Tip Angle, Compound Moisture, Curve Time and TC Profile were considered, DOE result indicate Tg & CTE of compound, package type and TC profile is Key factors for fracturing.
机译:本文介绍了TC(温度循环)和IOL(间歇运营寿命试验)后Cu线颈疲劳断裂问题的消除挑战。由于包装的应力内部,在TC1000循环和IOL15000循环后检测到资格批次。在详细分析横截面样本后,新鲜单位没有发现任何异常;但是沿着来自TC / IOL单元的Cu晶体的谷物边缘检测微裂缝。一个大挑战是寻找疲劳压裂的关键因素。如本文所介绍,考虑了丝环长度,环形型,环逆转数据,自由空气球尺寸,线型,线粒尺寸,毛细管尖角,复合水分,曲线时间和TC型材,DOE结果表明TG&化合物,包装类型和TC型材的CTE是压裂的关键因素。

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