Color detection for vision machine defect inspection on electronic devices

摘要

This paper presents a recent innovation introduced by Ismeca in our novel vision platform, NativeNET, for the detection of surface defects in electronic device packages due to decoloration and which could not detected before. Up to now, mainly due to cost and processing-time constraints, most of inspection vision systems were working with monochrome images. Moreover, there is a need from semiconductor packaging industry to be able to provide new smart inspection which can detect more defects.