Improving Quantification in Time of Flight (TOF) Mass Spectrometers by Optimizing Detector Response

摘要

The electron emission process that all electron multipliers rely on is a random process that is typically described with Poisson statistics. The output of electron multipliers is based on repeated electron emission events that occur on many discrete dynodes or along a continuous dynode structure. Calculating the pulse height distribution (the probability of measuring a pulse of a particular height for a single input event) from secondary electron yield data is difficult, but properties of pulse height have been calculated and are summarized by the curves shown in Figure 1.