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Chip Size Estimation for Effective Blending Ratio of Slurries in Wire Sawing of Silicon Wafers for Solar Cells

机译:用于太阳能电池硅晶片线锯片浆料中浆料中浆料的有效混合比的芯片尺寸估计

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Multi-wire sawing process with slurry has been popularly adopted for wafer slicing of silicon substrates for solar cells. This paper is to investigate the chip size estimation for effective blending ratio of mixing slurry of wire sawing. Different combination of slurry has been studied with microscopic pictures of abrasive grits by SEM and distribution of particle size of slurry. The chip size can be estimated by the developed method and then the TTV of sliced substrates is used to evaluate the blending ratio of slurry for cost efficiency of wire sawing. Experimental results indicate that the slurry with certain ratio of reborn grits increases the TTV value of sliced substrates. As the weight percentage of silicon chips is above 6% for the blending ratio of 50% reborn abrasive grits after sawing run 2, the slurry is suggested to be changed to new slurry for wire sawing. Under this developed rule, the average TTV can be maintained under 0.016 mm for nominal thickness of 200 μm silicon substrates. Results of this paper can be used to estimate the feasible blending ratio for maintaining the TTV under the desired specifications of silicon substrates for cost efficiency.
机译:具有浆料的多线锯工艺已经普遍采用太阳能电池的硅基板的晶片切片。本文探讨了线锯混合浆料的有效混合比的芯片尺寸估计。通过SEM和浆料的粒径分布,研究了浆料的微观图片的不同组合。芯片尺寸可以通过开发方法估计,然后使用切片基板的TTV来评估浆料的混合比以换金属锯的成本效率。实验结果表明,具有一定比例的浆料的浆料增加了切片基板的TTV值。随着硅芯片的重量百分比高于6%的锯齿250%重生磨粒的混合比率,建议将浆料改为用于电线锯切的新浆料。在该开发规则下,平均TTV可在0.016mm下保持,用于标称厚度为200μm硅基衬底。本文的结果可用于估计在硅基板的所需规格下维持TTV的可行性比例以进行成本效率。

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