首页> 外文会议>World Conference on Nondestructive Testing >Manufacturing of Reference Defects for NDT Using Low-Energy EDM
【24h】

Manufacturing of Reference Defects for NDT Using Low-Energy EDM

机译:使用低能量EDM制造NDT的参考缺陷

获取原文

摘要

For non-destructive testing (NDT) appropriate reference blocks are required in order to verify and calibrate a testing procedure. At BAM a special electric discharge machining (EDM) system has been developed which is able to manufacture artificial defects having a width down to 30 μm. Especially in the case of austenitic materials conventional EDM leads to a transformation of austenite to martensite. The martensite transformation causes a higher sensitivity of electromagnetic NDT methods (e. g. eddy current testing) at the artificial defects compared to natural defects of same size. The EDM system developed at BAM uses very low energy to avoid this material transformation. A side effect of the low-energy EDM is a lower surface roughness compared to conventional EDM. The artificial defects manufactured at BAM are measured optically and delivered with a certificate. A comparison of artificial defects shows the influence of material transformation on NDT and how differently the quality of the artificial defects can be.
机译:对于非破坏性测试(NDT),需要适当的参考块以验证和校准测试程序。在BAM处,已经开发了一种特殊的放电加工(EDM)系统,其能够制造宽度至30μm的人工缺陷。特别是在奥氏体材料的情况下,常规EDM导致奥氏体转化到马氏体。与相同尺寸的自然缺陷相比,马氏体转化导致电磁NDT方法的敏感性更高的电磁NDT方法(例如涡流测试)。在BAM开发的EDM系统使用非常低的能量来避免这种材料变换。与常规EDM相比,低能量EDM的副作用是较低的表面粗糙度。在BAM制造的人工缺陷光学测量并用证书递送。人工缺陷的比较显示了材料转化对NDT的影响以及人工缺陷的质量可以不同。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号