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TOFD Inspection with Phased Arrays

机译:与相控阵的TOFD检查

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In the last decades two major technologies changed the face of ultrasonic NDT viz., time of flight diffraction (TOFD) and phased array ultrasonic testing (PAUT). When used in conjunction, these two techniques allow for higher probability of detection (POD), normally requiring a great amount of time and/or experienced UT inspectors. To do TOFD however (even TOFD by itself),it is necessary to have different sets of probes with different probe separations when one wishes to inspect very thick materials.With the advent of more sensitive transducer arrays and faster electronics, we can now envisage, using multi-element probes, to perform multiple TOFD inspections (the different apertures, offsets and refracted angles all being changed electronically) in one run and with a minimum number of props. These different TOFD scans may also be merged a posteriori so that a simple global picture finally emerges from the acquired data.In this paper we will present some results achieved with this method as well as both theoretical and practical aspects of the problem.
机译:在过去的几十年中,两种主要技术改变了超声波NDT QZ的面孔,飞行时间衍射(TOFD)和相控阵超声波检测(PAUT)。当结合使用时,这两种技术允许更高的检测概率(POD),通常需要大量的时间和/或经验丰富的UT检查员。要做TOFD(即使是TOFD本身),当一个人希望检查非常厚的材料时,有必要具有不同的探针分离。随着更敏感的传感器阵列和更快的电子产品,我们现在可以设想,我们现在可以设想。使用多元素探针,以一次运行和具有最小数量的道具,执行多元素探针(不同的孔径,偏移,折射角度都被电动更改)。这些不同的TOFD扫描也可以合并后验,以便简单的全球图片最终从所获取的数据中出现。本文将在此方法中展示一些结果,以及问题的理论和实践方面。

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