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A new approach to lifetime and loading stress level estimation for Multilayer Ceramic Capacitors in Electronic Control Units

机译:电子控制单元多层陶瓷电容器寿命和加载应力水平估计的新方法

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This paper presents a new approach of lifetime and loading stress level estimation for Multilayer Ceramic Capacitors (MLCCs) to design a reliable Electronic Control Unit (ECU). These components are widely used in automotive ECU to perform functions as filtering, timing, buffering or noise reduction. The lifetime estimation is concerned to define the behavior of MLCCs over their lifespan in required high temperature operating conditions. These conditions have an unavoidable impact on MLCC mainly due to self-heating. The stress level of components is determined following a required high temperature operating profile and finding self-heating influence. For the loading stress level determination a Graphical User Interface (GUI) has been created. In notification area of the GUI, the obtained status predicts the future health of MLCCs for a proper functioning of ECU. Therefore the failure or degradation of ceramic capacitor caused by high temperature operating can be avoided if the lifetime is taking earlier into consideration within the design.
机译:本文介绍了多层陶瓷电容器(MLCC)的寿命和加载应力水平估计的新方法,以设计可靠的电子控制单元(ECU)。这些组件广泛用于汽车ECU,以执行滤波,定时,缓冲或降噪功能。寿命估计涉及在所需的高温操作条件下定义MLCCS在其寿命上的行为。这些条件对MLCC具有不可避免的影响,主要是由于自加热。在所需的高温操作型材之后确定部件的应力水平并找到自加热影响。对于加载应力级别确定,已经创建了图形用户界面(GUI)。在GUI的通知区域中,所获得的状态预测ECU适当运行的MLCC的未来健康状况。因此,如果寿命在设计内考虑到寿命,则可以避免由高温操作引起的陶瓷电容的故障或劣化。

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