In this paper we propose a mitigation technique for the protection of critical data in electronic devices firm Single Error Upsets (SEU) that manifest themselves as bit-flip in memory. In order to cope with this problem, we take advantage of involutional codes. We propose a methodology to generate a light decoder architecture considering all the possible combinations of generator polynomials of order three. The automatic generation of VHDL code is also addressed by exploiting a framework for coxes generation. The comparison with other protection schemes shows that the approach is advantageous in term s of perform and error coverage.
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