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DISRUPTION OF PARTICLE DETECTOR ELECTRONICS BY BEAM GENERATED EMI

机译:通过束生成的EMI破坏粒子探测器电子器件

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The possibility that radio frequency beam generated electromagnetic interference (EMI) could disrupt the operation of particle detector electronics has been of some concern since the inception of short pulse electron colliders more than 30 years ago [1]. Some instances have been reported where this may have occurred but convincing evidence has not been available. This possibility is of concern for the International Linear Collider (ILC). We have conducted test beam studies demonstrating that electronics disruption does occur using the vertex detector electronics (VXD) from the SLD detector which took data at the SLC at SLAC. We present the results of those tests, and we describe the need for EMI standards for beam and detector instrumentation in the IR region at the ILC.
机译:射频光束产生的电磁干扰(EMI)可能会破坏粒子检测器电子的操作的可能性在短暂的短脉冲电子煤机的初始以来,粒子探测器电子器件的操作已经存在了一些问题,从而超过30年前[1]。已经报告了一些情况,这可能发生但令人信服的证据尚未获得。这种可能性对于国际线性撞机(ILC)有担忧。我们已经进行了测试光束研究,证明使用来自SLD检测器的顶点检测器电子(VXD)发生电子检测器,其在SLAC处的SLC处进行数据。我们介绍了这些测试的结果,我们描述了ILC中IR地区的梁和探测器仪表的EMI标准的需求。

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