首页> 外文会议>IMEKO TC-4 International Symposium on Novelties in ELectrical Measurements and Instrumentation >Implementation of a DSP Based Impedance Measurement Instrument Using Ellipse Fitting Algorithms
【24h】

Implementation of a DSP Based Impedance Measurement Instrument Using Ellipse Fitting Algorithms

机译:使用椭圆拟合算法实现基于DSP的阻抗测量仪器

获取原文

摘要

In this paper, the DSP implementation of an impedance measurement instrument based on ellipse fitting algorithms is described. The system prototype is based on a commercial DSP kit with few external electronics for baseline assessment and requirements definition. The implemented system is tested for impedance magnitudes from 100 OMEGA up to 15 k(OMEGA), phases in the +-90 deg range at 1 kHz measuring frequency with extremely good results.
机译:在本文中,描述了基于椭圆拟合算法的阻抗测量仪器的DSP实现。系统原型基于商业DSP套件,外部电子设备少,用于基线评估和要求定义。从100Ω高达15K(OMEGA)的阻抗大小测试所实施的系统,在1kHz测量频率下+ -90°的阶段的相位具有极好的效果。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号