Wire, Optical Fibre And Cable, In Line Surface Quality Measurement And Defect Detection (SQM): Presentation Of The Development Test Results (Second Development Phase)

摘要

This presentation continue the previous one made for IWCS 2005 on basic principles and applications. The present one describe the progresses and present expectations after the first prototype development and experimentations. 1. The bad news is the SQM is not still ready for sale. 2. The good news is that it already can works for some applications at lower frequency and the technology we need to get the full performance is available and will be included soon. After running the first prototype, it appears we had to adapt the initial target to the technology limitations while keeping customer expectations. Some applications, need turn frequency at 200kHz, but accept 60 only dots per turn. This is already a far better resolution than all existing instruments for surface defect detection. Others, need high resolution, up to 200 dots per turn, but frequency significantly reduced, down to 80kHz.